OPTEOS, Inc. was founded in 2002 and is dedicated to the development and commercialization of novel, high-frequency, broad-bandwidth characterization instruments. The company is staffed with internationally renowned leaders in the research and development of innovative, optically-interrogated methods for the characterization of RF circuits and radiators.

Electro-optic field mapping and bandgap-modulation thermometry are patented techniques that have been developed under support of the U.S. Army Research Office, initially at the University of Michigan, and most recently at Opteos. During the R&D process, testing and refinement have been carried out in collaboration with many top industrial and academic laboratories. In all cases, new and often unexpected operational knowledge of a device under test was gained from the fresh perspective provided by this novel measurement paradigm. Our testing has also often resulted in dramatic improvements in circuit design that otherwise would have been possible only with extensive trial-and-error modification.