Opteos offers a variety of RF field probes, detection sensors and scanning systems for direct measurement of electric and magnetic fields.

Our systems can be customized to meet your specific measurement needs in terms of sensitivity, spatial resolution, instantaneous bandwidth, test medium, ruggedized packaging, etc.

Opteos's product offering ranges from custom EO/MO probes to turnkey field sensing systems complete with all the supporting electronics, control software, and post-processing tools for measured field data.

Opteos's field probes provide accurate multi-dimensional signal flow maps of RF, microwave and millimeter wave devices and circuits. They can be used for measurement of localized electric or magentic fields in time domain or for near field scanning of distributed areas in frequency domain.

Thanks to their non-invasive nature and small physical size, Opteos's field probes can be inserted into electrical enclosures via a very small access hole and used for interior EMC/EMI characterization as well.

Opteos's NEOSCAN^® field mapping system is an essential tool for test and evaluation of antennas and phased arrays. Our near field scanning system is capable of accurately measuring aperture-level field distributions with minimal invasiveness to the antenna under test. It can be used for phase characterization and calibration of phased array apertures as well.

The NEOSCAN^® system provides detailed field maps of passive and active devices and circuits including RFIC's and MMIC's. Such invaluable information can effectively be used for design validation, model verification, fault isolation or performance evaluation of various parts of your RF system.

Every OPTEOS sensing system is customized to your particular needs and application, and specifications vary widely. Please contact us to discuss your measurement requirements. 'Our engineers will recommend a system configuration that will best suit your measurement needs and budget.

Direct measurement of electric and magnetic fields in time domain has numerous commercial and military applications. Opteos's field probes can be used for sensing, detection and measurement of localized waveforms at circuit test points, inside packages and shieldings, and at the vicinity of devices and systems wherever there are detectable field levels. Such measurements provide valuable insight into the EMC/EMI performance or susceptibility of your RF devices, components or systems.

On the other extreme, our real-time field sensors can be used to test and evaluate the performance of high power microwave (HPM) systems as well as the effectiveness of shielding structures. Due to their non-metallic and almost RF-transparent nature, our probes can withstand very high dosages of incident RF power. Opteos's electric and magnetic field sensors can effectively be used to probe very high-voltage and high-current RF systems at microwave and millimeter wave bands.