Opteos provides a variety of field-scanning systems based on unique electro-optic and magneto-optic techniques.

The Opteos field-scanning systems can provide multi-dimensional internal-signal flow mapping for various RFICs, making design validation, fault isolation, and performance evaluation of complex modern circuits more convient and accurate than ever.

The Opteos field-scanning systems are also an essential tool for antenna/array test and evaluation. The field-scanning system is capable of providing aperture-level field distribution with minimal invasiveness to the AUT.

Due to the non-intrusive nature and small physical size of the probes used in the field-scanning system, it is possible to insert the probe into an electrical enclosure via a very small access hole. As a result, the field-scanning system can be used for interior EMC/EMI characterization as well as exterior applications.

Key Features include:

• From DC to over 100 GHz measurement bandwidth without any system reconfiguration
• Less than 8 um spatial resolution
• Simultaneous amplitude and phase measurement
• Separation of vector components
• Flexible system configuration
• Complete software package for data acquisition, data display, and post analysis