Opteos' field-scanning systems can be configured with a great degree of flexibility, which allows us to deliver effective and stream-lined near-field scanning systems that correspond precisely to the customer's needs. Besides the most popular configurations shown here, many different system options are available. Please contact Opteos determine the correct near-field-mapping system for your specific application.

Near-field Scanning System - Standard Type A

• The most comprehensive near-field scanning system
• Measurement bandwidth more than 100 GHz
• Scanning resolution as small as 8 um
• Simultaneous amplitude and phase scan
• Separate vectorial field-component measurement
• Three different types of probes (EO, MO, and Voltage) can be interchangeably used
• Suitable for any near-field scanning applications, including RFICs, radiators, or EMC/EMI

Near-field Scanning System - Standard Type B

• Near-field scanning system focused on amplitude measurement
• Measurement bandwidth can be up to 50 GHz
• Scanning resolution as small as 8 um
• Separate vectorial field component measurement
• Three different types of probes (EO, MO, and Voltage) can be interchangeably used
• Suitable for various EMC/EMI applications

System Expansion - Multi-Probe System

• Support multiple probes of same type or mixed probe types
• Can be combined with any field scanning system
• Can be used in scanning or stationary mode
• Multi-point measurements without any mechanical movement (stationary mode)
• Very fast multi-point measurements at a number of fixed measurement points
• Suitable for fast, repetitive product quality monitoring